UIUC ECE Title Bar ece444
Theory and Fabrication of Integrated Circuits University of Illinois at Urbana-Champaign logo

HOME · LECTURE · LAB · GT · CALCULATORS · Text Only

LAB HOME · SAFETY · CLASS TIMES · DEVICES · EQUIPMENT · MANUALS

Students testing

pn Junction Diodes

The ICS Instructions contain the basic procedures for making measurements. This screen is intended to point out things unique to using the DIODE model file.

Device Selection

The probing for the diode testing is the same as for the BJT testing, so it is most efficient to test the diodes and the BJTs together. Also, if your BJT is not working, it can be useful to make sure that the individual diodes in the BJT are working.

BJTs

• Measure the diodes on a square emitter BJT → the third BJT from the left on the bottom row is recommended.

Normally, you will be required to measure 3 sets of diodes from different device cells. Save your setup using Dataset(1,2,3) in Attribute #4 as you test your devices.

Probe Assignments

• SMU1 and CM(H) → probe1 → Base
• SMU2 and CM(L) → probe2 → Collector
• SMU3 and CM(L) → probe3 → Emitter

Note: CM(L) will have to be moved between the Collector(probe2) and Emitter(probe3) as needed to complete the measurements.

Perform the following tests in order:

1. MOS Capacitor

2. PMOSFET

3. pn Diode

4. BJT

ICS Reference

· Introduction

· Starting

· File Structure

· Test Setup

· Measurements

· Transforms

· Plots

Data Sheets

· MTP2955

· 2N2222A

Adobe Acrobat Reader Link Link will open in new window Download Adobe Reader to view the files.

Answers provided by this service may not be relevant to the materials presented in this website.

Department of Electrical and Computer Engineering
College of Engineering
University of Illinois Urbana-Champaign

Contact ece444
Copyright © 2007, 2008 The Board of Trustees at the University of Illinois. All rights reserved.

archives: ©1999   ©2000   ©2004   ©2005   ©2006