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Students testing

pn Junction Diodes

The ICS Instructions contain the basic procedures for making measurements. This screen is intended to point out things unique to using the DIODE model file.

Device Selection

The probing for the diode testing is the same as for the BJT testing, so it is most efficient to test the diodes and the BJTs together. Also, if your BJT is not working, it can be useful to make sure that the individual diodes in the BJT are working.

BJTs

• Measure the diodes on a square emitter BJT → the third BJT from the left on the bottom row is recommended.

Normally, you will be required to measure 3 sets of diodes from different device cells. Save your setup using Dataset(1,2,3) in Attribute #4 as you test your devices.

Probe Assignments

• SMU1 and CM(H) → probe1 → Base
• SMU2 and CM(L) → probe2 → Collector
• SMU3 and CM(L) → probe3 → Emitter

Note: CM(L) will have to be moved between the Collector(probe2) and Emitter(probe3) as needed to complete the measurements.

Perform the following tests in order:

1. MOS Capacitor

2. PMOSFET

3. pn Diode

4. BJT

ICS Reference

· Introduction

· Starting

· File Structure

· Test Setup

· Measurements

· Transforms

· Plots

Data Sheets

· MTP2955

· 2N2222A

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