ECE444 navigable mask
BJTs
Capacitors
Contact Resistance
Control Structures
Diodes
Inverters
Integrated Circuit Cells
Logo
Misalignment Structures
Miscellaneous FETs
nMOSFETs
pMOSFETs
Resistors
Device Cell
LASI was used for mask layout.
The mask set is currently under revision 1998: Dane Sievers, which is a minor redesign of revision 1994: Ron Stack. All revisions are based on the work of revision 1991: Kevin Tsurutome.
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Department of Electrical and Computer Engineering College of Engineering University of Illinois Urbana-Champaign
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